Opinions on Scanning electron microscope

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Not to be confused with Scanning tunneling microscope.

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.

The most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons depends on the angle at which beam meets surface of specimen, i.e. on specimen topography. By scanning the sample and collecting the secondary electrons with a special detector, an image displaying the topography of the surface is created.


In the image below, you can see a graph with the evolution of the times that people look for Scanning electron microscope. And below it, you can see how many pieces of news have been created about Scanning electron microscope in the last years.
Thanks to this graph, we can see the interest Scanning electron microscope has and the evolution of its popularity.

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